Faculty

Institution

Unit

Venue

Lloyd W Massengill

Professor of Electrical and Computer Engineering

Vanderbilt University

Affiliations

School of Engineering

Electrical and Computer Engineering

Lloyd W Massengill is currently serving as an Electrical And Computer Engineering Professor of Electrical and Computer Engineering at Vanderbilt University.

Honors

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Experiences

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Education

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Lloyd W Massengill

Vanderbilt University

Professor of Electrical and Computer Engineering

You can click a keyword to filter the displayed items

electrical engineering nuclear physics nuclear science applied physics nuclear engineering systems engineering power electronics engineering microelectronics optoelectronics electronics particle physics radiation semiconductors nuclear safety fusion engineering microwave technology reliability engineering nuclear power solid-state electronics defect tolerance reliability semiconductor devices single-event transients device reliability microelectronics reliability atomic physics vlsi technology semiconductor technology hardware reliability single-event effects nuclear medicine thermal engineering radiation effects circuit design soft errors electronic materials dosimetry single event effects radio engineering nuclear energy circuit analysis laser science circuit simulation advanced technology nodes technology scaling device modeling frequency control silicon on insulator set pulse widths advanced technologies temperature dependence single event upsets power semiconductor devices electronic engineering condition monitoring microwave engineering radio frequency radiation biology error correction fault estimation analog design digital cmos soft-error rates single-event transient pulse frequency dependence soft error rates bulk cmos elevated temperatures numerical simulations nuclear materials error correction code semiconductor device fabrication radiation protection scientific computing information technology computer engineering vlsi circuit analog behavioral modeling

Notable Scholarly Works

Notable Federal Grants

Collaborators

Effectiveness of Niel as a Predictor of Single Event Displacement Damage Effects in Cmos Circuits. IEEE Transactions on Nuclear Science (2024)

James M. TrippeBrian D. SierawskiGrant MayberryHannah M. DattiloSokrates T. PantelidesDaniel M. FleetwoodRonald D. SchrimpfLloyd W. MassengillRobert A. Reed

computational electromagneticshardware reliabilitymechanical engineeringintegrated circuitscircuit simulationsystems engineeringvlsi designengineeringnuclear sciencecircuit reliabilitycmos circuitscircuit designradiationvlsi technologyvlsi circuitmicroelectronics reliabilityelectronicsmicroelectronicsnanoelectronics

The Effects of Threshold Voltage and Number of Fins Per Transistor on the Tid Response of Gf 12Lp Technology. IEEE Transactions on Nuclear Science (2024)

Aldo I. VidanaNathaniel A. DoddsR. Nathan NowlinTrace M. WallacePhil J. OldigesBrian M. DoddJenny XiongRick M. CadenaJames TrippeJeffrey S. KauppilaLloyd W. MassengillHugh J. Barnaby

sensorsnuclear engineeringradiation oncologynuclear safetynuclear physicsnuclear powernuclear scienceelectrical engineeringtid responsethreshold voltageradiationapplied physicsvlsi technology

Analysis of Single-Event Upsets and Transients in 22 Nm Fully Depleted Silicon-On-Insulator Logic. IEEE Transactions on Nuclear Science (2023)

Joseph V. D’AmicoSean T. VibbertArthur C. WatkinsBenjamin C. FahrenkrugTim D. HaeffnerDennis R. BallAndrew L. SternbergMichael L. AllesJeffrey S. KauppilaLloyd W. Massengill

nuclear safetynuclear physicsnuclear magnetic resonancesystems engineeringparticle physicsnuclear decaysatomic physicsnuclear sciencesilicon on insulatorelectrical engineeringsilicon-on-insulator logicvlsi technologynuclear engineeringsingle-event upsetsnuclear powerpower electronicsmicroelectronics reliabilityelectronicsapplied physicsmicroelectronics

On-Chip Emulation and Measurement of Variable-Length Photocurrents in Sub-50Nm Ics. IEEE Transactions on Nuclear Science (2023)

Joseph V. D’AmicoSean T. VibbertRick M. CadenaMichael L. AllesDennis R. BallAndrew L. SternbergEn Xia ZhangW. Timothy HolmanJeffrey S. KauppilaLloyd W. Massengill

nuclear engineeringradiation oncologynuclear physicsvariable-length photocurrentsoptoelectronicsnuclear scienceelectrical engineeringon-chip emulationapplied physics

Total-Ionizing-Dose Effects and Low-Frequency Noise in N-Type Carbon Nanotube Field-Effect Transistors With Hfo₂ Gate Dielectrics. IEEE Transactions on Nuclear Science (2023)

Patrick K. Darmawi-IskandarAndrew M. AaronEn Xia ZhangBharat L. BhuvaJeffery S. KauppilaJim L. DavidsonMichael L. AllesDaniel M. FleetwoodLloyd W. Massengill

nuclear engineeringfield-effect transistorsmicrowave technologycarbon nanotubesnuclear physicsengineeringlow-frequency noisenuclear poweroptoelectronicsnuclear scienceelectrical engineeringelectronic materialsnuclear energytotal-ionizing-dose effectselectronicsapplied physicsmicroelectronicsnanoelectronics

Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Shifts Using Back-Gate Biasing in 22-Nm Fd-Soi Transistors. IEEE Transactions on Nuclear Science (2022)

A. C. WatkinsS. T. VibbertJ. V. D'AmicoJ. S. KauppilaT. D. HaeffnerD. R. BallE. X. ZhangK. M. WarrenM. L. AllesL. W. Massengill

nuclear engineeringradiation oncologynuclear physicsnanotechnologyback-gate biasingtotal-ionizing-dose-induced threshold-voltage shiftsnuclear scienceelectrical engineeringapplied physicsmicroelectronics

Summary of Recent Total Ionizing Dose Testing on Gf 12Lp Cmos Technology.. (2022)

Hugh BarnabyTrace WallaceMatthew MarinellaJereme NeuendankDonald WilsonLloyd MassengillJeff KauppilaGrant Poe

radiation oncologytechnologysemiconductor technologycmos technologysemiconductors

Analysis of Single-Event Transients (Sets) Using Machine Learning (ML) and Ionizing Radiation Effects Spectroscopy (Ires). IEEE Transactions on Nuclear Science (2021)

T. D. LovelessD. R. ReisingJ. C. CancelleriL. W. MassengillD. McMorrow

systems engineeringradiation oncologynuclear physicsnuclear scienceelectrical engineeringsingle-event transientsmachine learning

Frequency, Let, and Supply Voltage Dependence of Logic Soft Errors at the 7-Nm Node. 2022 IEEE International Reliability Physics Symposium (IRPS) (2021)

Y. XiongA. FeeleyL.W. MassengillB.L. BhuvaS.-J. WenR. Fung

device reliabilitylogic soft errorselectrical engineeringpower electronicsmicroelectronicssupply voltage dependence

In Situ Measurement of Tid-Induced Leakage Using On-Chip Frequency Modulation. IEEE Transactions on Nuclear Science (2021)

S. T. VibbertA. C. WatkinsJ. V. D'AmicoM. W. McKinneyD. S. VibbertE. X. ZhangD. R. BallT. D. HaeffnerM. L. AllesJ. S. KauppilaL. W. Massengill

nuclear engineeringnuclear safetymicrowave technologyleakage detectionnuclear physicsengineeringon-chip frequency modulationnuclear scienceelectrical engineeringapplied physicstid-induced leakage

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Lloyd W Massengill

Professor of Electrical and Computer Engineering

Vanderbilt University

Affiliations

School of Engineering

Electrical and Computer Engineering

Lloyd W Massengill is currently serving as an Electrical And Computer Engineering Professor of Electrical and Computer Engineering at Vanderbilt University.

Honors

Create free account to unlock more features

Experiences

Create free account to unlock more features

Education

Create free account to unlock more features

Lloyd W Massengill

Vanderbilt University

Professor of Electrical and Computer Engineering

You can click a keyword to filter the displayed items

Notable Scholarly Works

Notable Federal Grants

Collaborators

Effectiveness of Niel as a Predictor of Single Event Displacement Damage Effects in Cmos Circuits. IEEE Transactions on Nuclear Science (2024)

James M. TrippeBrian D. SierawskiGrant MayberryHannah M. DattiloSokrates T. PantelidesDaniel M. FleetwoodRonald D. SchrimpfLloyd W. MassengillRobert A. Reed

The Effects of Threshold Voltage and Number of Fins Per Transistor on the Tid Response of Gf 12Lp Technology. IEEE Transactions on Nuclear Science (2024)

Aldo I. VidanaNathaniel A. DoddsR. Nathan NowlinTrace M. WallacePhil J. OldigesBrian M. DoddJenny XiongRick M. CadenaJames TrippeJeffrey S. KauppilaLloyd W. MassengillHugh J. Barnaby

sensorsnuclear engineeringradiation oncologynuclear safetynuclear physicsnuclear powernuclear scienceelectrical engineeringtid responsethreshold voltageradiationapplied physicsvlsi technology

Analysis of Single-Event Upsets and Transients in 22 Nm Fully Depleted Silicon-On-Insulator Logic. IEEE Transactions on Nuclear Science (2023)

Joseph V. D’AmicoSean T. VibbertArthur C. WatkinsBenjamin C. FahrenkrugTim D. HaeffnerDennis R. BallAndrew L. SternbergMichael L. AllesJeffrey S. KauppilaLloyd W. Massengill

On-Chip Emulation and Measurement of Variable-Length Photocurrents in Sub-50Nm Ics. IEEE Transactions on Nuclear Science (2023)

Joseph V. D’AmicoSean T. VibbertRick M. CadenaMichael L. AllesDennis R. BallAndrew L. SternbergEn Xia ZhangW. Timothy HolmanJeffrey S. KauppilaLloyd W. Massengill

nuclear engineeringradiation oncologynuclear physicsvariable-length photocurrentsoptoelectronicsnuclear scienceelectrical engineeringon-chip emulationapplied physics

Total-Ionizing-Dose Effects and Low-Frequency Noise in N-Type Carbon Nanotube Field-Effect Transistors With Hfo₂ Gate Dielectrics. IEEE Transactions on Nuclear Science (2023)

Patrick K. Darmawi-IskandarAndrew M. AaronEn Xia ZhangBharat L. BhuvaJeffery S. KauppilaJim L. DavidsonMichael L. AllesDaniel M. FleetwoodLloyd W. Massengill

Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Shifts Using Back-Gate Biasing in 22-Nm Fd-Soi Transistors. IEEE Transactions on Nuclear Science (2022)

A. C. WatkinsS. T. VibbertJ. V. D'AmicoJ. S. KauppilaT. D. HaeffnerD. R. BallE. X. ZhangK. M. WarrenM. L. AllesL. W. Massengill

Summary of Recent Total Ionizing Dose Testing on Gf 12Lp Cmos Technology.. (2022)

Hugh BarnabyTrace WallaceMatthew MarinellaJereme NeuendankDonald WilsonLloyd MassengillJeff KauppilaGrant Poe

radiation oncologytechnologysemiconductor technologycmos technologysemiconductors

Analysis of Single-Event Transients (Sets) Using Machine Learning (ML) and Ionizing Radiation Effects Spectroscopy (Ires). IEEE Transactions on Nuclear Science (2021)

T. D. LovelessD. R. ReisingJ. C. CancelleriL. W. MassengillD. McMorrow

systems engineeringradiation oncologynuclear physicsnuclear scienceelectrical engineeringsingle-event transientsmachine learning

Frequency, Let, and Supply Voltage Dependence of Logic Soft Errors at the 7-Nm Node. 2022 IEEE International Reliability Physics Symposium (IRPS) (2021)

Y. XiongA. FeeleyL.W. MassengillB.L. BhuvaS.-J. WenR. Fung

device reliabilitylogic soft errorselectrical engineeringpower electronicsmicroelectronicssupply voltage dependence

In Situ Measurement of Tid-Induced Leakage Using On-Chip Frequency Modulation. IEEE Transactions on Nuclear Science (2021)

S. T. VibbertA. C. WatkinsJ. V. D'AmicoM. W. McKinneyD. S. VibbertE. X. ZhangD. R. BallT. D. HaeffnerM. L. AllesJ. S. KauppilaL. W. Massengill

nuclear engineeringnuclear safetymicrowave technologyleakage detectionnuclear physicsengineeringon-chip frequency modulationnuclear scienceelectrical engineeringapplied physicstid-induced leakage

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Similar Faculty Members

Robert A. Reed

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radiation

radiation oncology

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Institution

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electrical engineering

microelectronics

Michael L Alles

Institution

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radiation

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Robert A Weller

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device modeling

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University of California, Santa Cruz

ultra-low power devices

nanotechnology

Sung Mo Kang

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University of California, Santa Cruz

computer engineering

neuromorphic engineering

Ronald D Schrimpf

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semiconductor

microelectronics reliability

Eby G. Friedman

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University of Rochester

circuit simulation

3-d circuit design

Sanjay Banerjee

Institution

University of Texas at Austin

semiconductor device

electronic material

M. C. Frank Chang

Institution

University of California, Los Angeles

analog systems

microwave engineering