Faculty

Institution

Unit

Venue

Elyse Rosenbaum

Professor

University of Illinois Urbana-Champaign

Affiliations

The Grainger College of Engineering

Department of Electrical and Computer Engineering

Elyse Rosenbaum is currently serving as an Electrical And Computer Engineering Professor at University of Illinois Urbana-Champaign.

Honors

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Experiences

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Education

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Elyse Rosenbaum

University of Illinois Urbana-Champaign

Professor

You can click a keyword to filter the displayed items

electrical engineering integrated circuits microelectronics computer engineering vlsi circuit microelectronics reliability vlsi technology engineering electronics circuit simulation semiconductors modeling and simulation device modeling circuit reliability device reliability applied physics electromagnetic compatibility reliability engineering vlsi design electronic packaging solid-state electronics semiconductor devices high voltage engineering hardware reliability time-dependent dielectric breakdown reliability physics stress-induced leakage current bias temperature instability circuit design circuit analysis power electronics electronic materials electrical insulation physical design (electronics) beyond cmos esd protection reliability mixed-signal integrated circuits advanced dielectric interconnect (integrated circuits) electronic engineering advanced packaging (semiconductors) instrumentation semiconductor technology radio frequency recurrent neural networks thin films thermal engineering rf subsystem circuit system external latchup electrostatic discharge computational electromagnetics microwave technology rf semiconductor transmission line failure detection on-chip esd protection numerical simulations power semiconductor devices oxide electronics circuit-level simulation compact model thermal modeling silicon on insulator microwave engineering cmos vlsi chips deep submicron mosfets soi technology trigger voltage berkeley reliability tools deuterium isotope effect cmos vlsi circuits heat conduction accelerated testing compact modeling device physics

Video Presentations

Notable Scholarly Works

Notable Federal Grants

Collaborators

Exploiting Chiplet Integration Technology for Fast High-Capacity Dram Modules. IEEE Transactions on Very Large Scale Integration (VLSI) Systems (2025)

Zihan XiaChihun SongRam KrishnaAshita VictorSrujan PentaMuhannad S. BakirElyse RosenbaumNam Sung KimMingu Kang

memory architectureschiplet integration technologymicroarchitecturecomputer engineeringcomputer architecturemulti-channel memory architectureintegrated circuitsmicroelectronics

New Loss Function for Learning Dielectric Thickness Distributions and Generative Modeling of Breakdown Lifetime. 2022 IEEE International Reliability Physics Symposium (IRPS) (2025)

Weiman YanErnest WuElyse Rosenbaum

breakdown lifetimereliability engineeringnew loss functionmodeling and simulationphysic of failuremicroelectronicsfailure predictiongenerative modelingadvanced dielectriccomputational engineeringmicroelectronics reliabilityreliability predictiontime-dependent dielectric breakdownreliability physicslife predictionelectrical insulationapplied probabilityelectrical engineeringengineeringstatistical models

Optimized Cdm-Esd Protection for 100+ Gbps Wireline Io in 16-Nm Cmos. 2022 IEEE International Reliability Physics Symposium (IRPS) (2025)

Shudong HuangElyse Rosenbaum

cdm-esd protectionvlsi design16-nm cmoscomputer engineeringgbps wireline iomicroelectronics reliabilitylow-power electronicsintegrated circuitselectrical engineeringmicroelectronicsvlsi technologyvlsi circuit

Tddb Characterization of High-K Gate Dielectric on a Sub-Nanosecond Timescale. 2022 IEEE International Reliability Physics Symposium (IRPS) (2025)

Matthew DrallmeierElyse Rosenbaum

physicsbias temperature instabilityelectronic engineeringadvanced dielectricsemiconductor devicescondensed matter physicssolid-state electronicstddb characterizationelectronicssemiconductorselectrical engineeringmicroelectronicsapplied physicstime-dependent dielectric breakdowncharacterization (materials science)

Accuracy Preserving Extensions to a Pdk Mosfet Model for Esd Simulation. (2024)

Yujie ZhouElyse Rosenbaum

circuit simulationcomputer engineeringcomputational engineeringaccuracy preserving extensionsesd simulationmodeling and simulationelectrical engineeringpdk mosfet modelvlsi technologydevice modelingengineeringvlsi circuit

On-Chip Esd Protection for Multi-Gbps Automotive Serial Io in a 16-Nm Finfet Process. (2024)

Shudong HuangSrivatsan ParthasarathyYuanzhong Paul ZhouJean-Jacques HajjarElyse Rosenbaum

on-chip esd protection16-nm finfet processcomputer engineeringintegrated circuitselectrical engineeringmicroelectronicsvlsi circuitvlsi technologyhardware security

On-Chip Single-Shot Pulse Generator for Tddb Characterization on a Sub-Nanosecond Timescale. 2022 IEEE International Reliability Physics Symposium (IRPS) (2024)

Matthew DrallmeierYujie ZhouElyse Rosenbaum

vlsi designcomputer engineeringhigh voltage engineeringtime-dependent dielectric breakdownmicroelectronics reliabilitybreakdown voltageintegrated circuitselectronicson-chip pulse generatorelectrical engineeringmicroelectronicspulse generatorvlsi technologyengineeringvlsi circuit

Reduced Rc Time Constant High Voltage Tolerant Supply Clamp for Esd Protection in 16Nm Finfet Technology. 2022 IEEE International Reliability Physics Symposium (IRPS) (2024)

Shudong HuangSrivatsan ParthasarathyYuanzhong ZhouJean-Jacques HajjarElyse Rosenbaum

finfet technologyintegrated circuitsesd protectionelectrical engineeringmicroelectronics

Yield-Aware Interposer Design for Ucie Interconnects. 33rd IEEE Conference on Electrical Performance of Electronics Packaging and System (EPEPS) (2024)

Ram KrishnaAshita VictorSrujan PentaXu ChenMuhannad S. BakirNam Sung KimElyse Rosenbaum

advanced packaging (semiconductors)physical design (electronics)interconnect (integrated circuits)microarchitecturecomputer engineeringcomputer architecturemicroelectronics reliabilityintegrated circuitselectronic packagingyield-aware interposer designelectrical engineeringmicroelectronicsvlsi technologyvlsi circuit

Collector Engineering of Esd Pnp in Bcd Technologies. 2022 IEEE International Reliability Physics Symposium (IRPS) (2023)

Yujie ZhouDavid LaFonteeseElyse Rosenbaum

esd pnpelectronic engineeringhigh voltage engineeringpnp bipolar transistorsmicroelectronics reliabilityintegrated circuitscollector engineeringelectronicselectrical engineeringmicroelectronicsengineering

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Elyse Rosenbaum

Professor

University of Illinois Urbana-Champaign

Affiliations

The Grainger College of Engineering

Department of Electrical and Computer Engineering

Elyse Rosenbaum is currently serving as an Electrical And Computer Engineering Professor at University of Illinois Urbana-Champaign.

Honors

Create free account to unlock more features

Experiences

Create free account to unlock more features

Education

Create free account to unlock more features

Elyse Rosenbaum

University of Illinois Urbana-Champaign

Professor

You can click a keyword to filter the displayed items

Video Presentations

Notable Scholarly Works

Notable Federal Grants

Collaborators

Exploiting Chiplet Integration Technology for Fast High-Capacity Dram Modules. IEEE Transactions on Very Large Scale Integration (VLSI) Systems (2025)

Zihan XiaChihun SongRam KrishnaAshita VictorSrujan PentaMuhannad S. BakirElyse RosenbaumNam Sung KimMingu Kang

memory architectureschiplet integration technologymicroarchitecturecomputer engineeringcomputer architecturemulti-channel memory architectureintegrated circuitsmicroelectronics

New Loss Function for Learning Dielectric Thickness Distributions and Generative Modeling of Breakdown Lifetime. 2022 IEEE International Reliability Physics Symposium (IRPS) (2025)

Weiman YanErnest WuElyse Rosenbaum

Optimized Cdm-Esd Protection for 100+ Gbps Wireline Io in 16-Nm Cmos. 2022 IEEE International Reliability Physics Symposium (IRPS) (2025)

Shudong HuangElyse Rosenbaum

Tddb Characterization of High-K Gate Dielectric on a Sub-Nanosecond Timescale. 2022 IEEE International Reliability Physics Symposium (IRPS) (2025)

Matthew DrallmeierElyse Rosenbaum

Accuracy Preserving Extensions to a Pdk Mosfet Model for Esd Simulation. (2024)

Yujie ZhouElyse Rosenbaum

On-Chip Esd Protection for Multi-Gbps Automotive Serial Io in a 16-Nm Finfet Process. (2024)

Shudong HuangSrivatsan ParthasarathyYuanzhong Paul ZhouJean-Jacques HajjarElyse Rosenbaum

on-chip esd protection16-nm finfet processcomputer engineeringintegrated circuitselectrical engineeringmicroelectronicsvlsi circuitvlsi technologyhardware security

On-Chip Single-Shot Pulse Generator for Tddb Characterization on a Sub-Nanosecond Timescale. 2022 IEEE International Reliability Physics Symposium (IRPS) (2024)

Matthew DrallmeierYujie ZhouElyse Rosenbaum

Reduced Rc Time Constant High Voltage Tolerant Supply Clamp for Esd Protection in 16Nm Finfet Technology. 2022 IEEE International Reliability Physics Symposium (IRPS) (2024)

Shudong HuangSrivatsan ParthasarathyYuanzhong ZhouJean-Jacques HajjarElyse Rosenbaum

finfet technologyintegrated circuitsesd protectionelectrical engineeringmicroelectronics

Yield-Aware Interposer Design for Ucie Interconnects. 33rd IEEE Conference on Electrical Performance of Electronics Packaging and System (EPEPS) (2024)

Ram KrishnaAshita VictorSrujan PentaXu ChenMuhannad S. BakirNam Sung KimElyse Rosenbaum

Collector Engineering of Esd Pnp in Bcd Technologies. 2022 IEEE International Reliability Physics Symposium (IRPS) (2023)

Yujie ZhouDavid LaFonteeseElyse Rosenbaum

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circuit simulation

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digital manufacturing

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big data

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circuit simulation

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