Faculty

Institution

Unit

Venue

Chadwin D. Young

Associate Professor

University of Texas at Dallas

Affiliations

Erik Jonsson School of Engineering and Computer Science

Electrical and Computer Engineering

Materials Science and Engineering

Chadwin D. Young is currently serving as an Electrical And Computer Engineering Associate Professor at University of Texas At Dallas.

Honors

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Experiences

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Education

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Chadwin D. Young

University of Texas at Dallas

Associate Professor

You can click a keyword to filter the displayed items

materials science electrical engineering optoelectronics microelectronics electronics applied physics semiconductors solid-state electronics electronic materials thin films power electronics engineering semiconductor devices semiconductor technology condensed matter physics reliability materials engineering nanoelectronics semiconductor device fabrication microelectronics reliability reliability engineering oxide electronics high voltage engineering semiconductor nanostructures printed electronics device reliability semiconductor materials microwave technology advanced dielectric high-k dielectrics material research thermal engineering ferroelectric application vacuum device compound semiconductors high-k gate stacks electrical characterization interface science aluminum gallium nitride high-k gate dielectrics high-k devices material chemistry charge transport bias temperature instability constant voltage stress condensed matter vlsi technology thin film processing silicon on insulator advanced electrode material pulsed laser deposition electronic engineering low temperature nuclear science electronic packaging nuclear engineering micro technology micro-electromechanical systems interface chemistry power engineering electrical properties intermittently connected device surface modification organic electronics epitaxial growth charge trapping laser deposition electrode-electrolyte interfaces time-dependent dielectric breakdown stress-induced crystallization border traps low-voltage operation spatial distributions electron trap generation gate stack intrinsic characteristics

Notable Scholarly Works

Notable Federal Grants

Collaborators

Bulk Single Crystalline β-Ga2O3 (001) Surface Analyzed by Xps. Surface Science Spectra (2026)

surface sciencegallium oxidesurface analysischaracterization (materials science)surface characterizationcrystal growthmaterials science

Surface Analysis of Bulk Monocrystalline β-Ga2O3(2¯01) via X-Ray Photoelectron Spectroscopy. Surface Science Spectra (2026)

surface sciencegallium oxidesurface analysissurface characterizationcrystal growthmaterials science

Xps Spectral Analysis of the (010) Surface of Bulk Sn-Doped β-Ga2O3 Single Crystals. Surface Science Spectra (2026)

crystal researchsurface sciencegallium oxidesurface analysissurface characterizationoxide electronicsmaterials science

Bismuth Oxychloride as a Van Der Waals Dielectric for 2D Electronics. Nanotechnology (2025)

Aswin L N KondusamyWenhao LiuJoy RoyXiangyu ZhuConnor V SmithXinglu WangMoon J KimChadwin YoungRobert M WallaceWilliam G VandenbergheBing Lv

electronicsnanotechnologymaterials sciencevan der waals

D-Mode Gan/Algan/Gan Mos-Hemt Test Structures for Evaluating Gate Dielectric Impact on Device Performance. (2025)

electronicsgan power deviceengineeringelectrical engineeringaluminum gallium nitridesemiconductorsapplied physics

Investigation of the Impact of Hydrogen Defects on the Vt Shift in Back-Gate Igzo Tfts. (2025)

electronicssemiconductor deviceselectronic engineeringsemiconductor technologyelectrical engineeringvlsi circuitintegrated circuitsstress-induced leakage currentsemiconductorsmicroelectronicshydrogen

Methodology and Test Structures for Studying β-Ga 2 O 3 Dielectric and Contact Interfaces. (2025)

interface propertiesinterface scienceelectrical insulationgallium oxideadvanced dielectricelectrical propertiescharacterization (materials science)interface phenomenoninterface structureapplied physicsinterface (matter)condensed matter physicsmaterials science

The Characterization and Understanding of Electrically Active Defects in the Hfo2/β-Ga2O3(201) Mos System. APL Materials (2025)

solid-state electronicsdefect formationadvanced materialsoxide electronicsgallium oxidematerial researchadvanced dielectricepitaxial growthelectronic materialscharacterization (materials science)semiconductorsapplied physicsthin filmsmaterials science

Evaluation of Lab-Based Lithium Niobate Surface Acoustic Wave Test Structure Using Efficient Maskless Lithography and Sma Connection Approach for Microfluidic Applications. (2024)

Mohammad Salman ParvezShadhin HussainMatthew GoecknerChadwin D. YoungJeong-Bong JB Lee

microfluidic applicationssurface sciencetest structuremicrofluidicsmaterials science

Reliability Assessment of A-Igzo and Zno Thin Film Transistors (Tfts) to X-Ray Irradiation. 2022 IEEE International Reliability Physics Symposium (IRPS) (2024)

R.A. Rodriguez-DavilaL. Fernandez-IzquierdoJ. FinkT. MoiseR.C. BaumannB. GnadeM. Quevedo-LopezC.D. Young

radiation oncologyreliability assessmentoptoelectronicsradiologyx-ray irradiationthin filmsmaterials science

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Chadwin D. Young

Associate Professor

University of Texas at Dallas

Affiliations

Erik Jonsson School of Engineering and Computer Science

Electrical and Computer Engineering

Materials Science and Engineering

Chadwin D. Young is currently serving as an Electrical And Computer Engineering Associate Professor at University of Texas At Dallas.

Honors

Create free account to unlock more features

Experiences

Create free account to unlock more features

Education

Create free account to unlock more features

Chadwin D. Young

University of Texas at Dallas

Associate Professor

You can click a keyword to filter the displayed items

Notable Scholarly Works

Notable Federal Grants

Collaborators

Bulk Single Crystalline β-Ga2O3 (001) Surface Analyzed by Xps. Surface Science Spectra (2026)

surface sciencegallium oxidesurface analysischaracterization (materials science)surface characterizationcrystal growthmaterials science

Surface Analysis of Bulk Monocrystalline β-Ga2O3(2¯01) via X-Ray Photoelectron Spectroscopy. Surface Science Spectra (2026)

surface sciencegallium oxidesurface analysissurface characterizationcrystal growthmaterials science

Xps Spectral Analysis of the (010) Surface of Bulk Sn-Doped β-Ga2O3 Single Crystals. Surface Science Spectra (2026)

crystal researchsurface sciencegallium oxidesurface analysissurface characterizationoxide electronicsmaterials science

Bismuth Oxychloride as a Van Der Waals Dielectric for 2D Electronics. Nanotechnology (2025)

Aswin L N KondusamyWenhao LiuJoy RoyXiangyu ZhuConnor V SmithXinglu WangMoon J KimChadwin YoungRobert M WallaceWilliam G VandenbergheBing Lv

electronicsnanotechnologymaterials sciencevan der waals

D-Mode Gan/Algan/Gan Mos-Hemt Test Structures for Evaluating Gate Dielectric Impact on Device Performance. (2025)

electronicsgan power deviceengineeringelectrical engineeringaluminum gallium nitridesemiconductorsapplied physics

Investigation of the Impact of Hydrogen Defects on the Vt Shift in Back-Gate Igzo Tfts. (2025)

electronicssemiconductor deviceselectronic engineeringsemiconductor technologyelectrical engineeringvlsi circuitintegrated circuitsstress-induced leakage currentsemiconductorsmicroelectronicshydrogen

Methodology and Test Structures for Studying β-Ga 2 O 3 Dielectric and Contact Interfaces. (2025)

The Characterization and Understanding of Electrically Active Defects in the Hfo2/β-Ga2O3(201) Mos System. APL Materials (2025)

Evaluation of Lab-Based Lithium Niobate Surface Acoustic Wave Test Structure Using Efficient Maskless Lithography and Sma Connection Approach for Microfluidic Applications. (2024)

Mohammad Salman ParvezShadhin HussainMatthew GoecknerChadwin D. YoungJeong-Bong JB Lee

microfluidic applicationssurface sciencetest structuremicrofluidicsmaterials science

Reliability Assessment of A-Igzo and Zno Thin Film Transistors (Tfts) to X-Ray Irradiation. 2022 IEEE International Reliability Physics Symposium (IRPS) (2024)

R.A. Rodriguez-DavilaL. Fernandez-IzquierdoJ. FinkT. MoiseR.C. BaumannB. GnadeM. Quevedo-LopezC.D. Young

radiation oncologyreliability assessmentoptoelectronicsradiologyx-ray irradiationthin filmsmaterials science

1
2
3
4
5
27
10 / page

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Similar Faculty Members

Jiyoung Kim

Institution

University of Texas at Dallas

advanced materials

thin film

Neil Goldsman

Institution

University of Maryland, College Park

electrical engineering

materials science

John F. Conley, Jr.

Institution

Oregon State University

internal photoemission spectroscopy

nanomaterials

Yoshio Nishi

Institution

Stanford University

oxygen migration

semiconductor

Siddharth Rajan

Institution

Ohio State University

semiconductor

gan power device

Mark Law

Institution

University of Florida

circuit simulation

partial differential equation

Mark Goorsky

Institution

University of California, Los Angeles

porous semiconductors

applied physics

Manuel Quevedo

Institution

University of Texas at Dallas

sensor

material chemistry

Steven Ringel

Institution

Ohio State University

materials science

optoelectronics

Robert A Weller

Institution

Vanderbilt University

device modeling

radiation