Ahmad E. IslamNicholas P. SepelakAdam T. MiesleHanwool LeeMichael SnureStefan NikodemskiDennis E. WalkerNicholas C. MillerMatt GrupenKevin D. LeedyKyle J. LiddyAntonio CrespoGary R. HughesWenjuan ZhuBrian PolingStephen TetlakKelson D. ChabakAndrew J. Green
gan power devicerf semiconductorelectronic materials~140-nm gate lengthhigh temperaturesolid-state electronicselectronicssemiconductorselectrical engineeringmicroelectronicswide-bandgap semiconductorsperformance degradationapplied physicsaluminum gallium nitrideengineering