Faculty

Institution

Unit

Venue

John Essick

David W Brauer Professor of Physics

Reed College

Affiliations

Mathematical and Natural Sciences

Physics

John Essick is currently serving as a Mathematical And Natural Sciences David W Brauer Professor of Physics at Reed College.

Honors

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Experiences

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Education

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John Essick

Reed College

David W Brauer Professor of Physics

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applied physics physics materials science semiconductors solid-state electronics electronic materials thin films microelectronics reliability electronics electrical engineering microelectronics nanoelectronics quantum heterostructures characterization (materials science) crystal growth advanced dielectric vlsi technology condensed matter condensed matter physics advanced functional materials material research optoelectronics luminescence nonlinear phenomenon lightwave technology light science interface science power electronics power delivery high voltage engineering capacitance-voltage profiling muon mass instructional laboratory nanotechnology spectroscopy particle beam quantum dots photonics optical properties engineering science molecular physics atomic spectroscopy nanophotonics electron configuration crystal research quantum engineering quantum materials atomic physics laser absorption spectrometry quantum chemistry optical materials lasers quantum science vibrational spectroscopy nature physic ultrafast laser spectroscopy photonic crystals raman spectroscopy

Notable Scholarly Works

Notable Federal Grants

Collaborators

Chaos in the Monopole Ion Trap. American Journal of Physics (2020)

nonlinear scienceelectromagnetismphysicsnonlinear phenomenonatomic physicsmagnetohydrodynamicsapplied physics

Chaos and Bifurcations in the Monopole Ion Trap. Bulletin of the American Physical Society (2018)

biophysicsnonlinear scienceelectromagnetismnonlinear phenomenonphysicsatomic physicsdynamical systems

Determining the Muon Mass Using a Scintillator-Based Detector. American Journal of Physics (2017)

particle physicsphysicsnuclear physicsnuclear scienceexperimental physicselementary particles

Capacitance-Voltage Profiling: Research-Grade Approach Versus Low-Cost Alternatives. American Journal of Physics (2014)

high voltage engineeringmeasurementcapacitance-voltage profilingpower deliverycomputer engineeringelectrical engineeringpower electronicselectric power systemsmicroelectronics

Determining the Muon Mass in an Instructional Laboratory. American Journal of Physics (2009)

Benjamin BrauChristopher MayRobert OrmondJohn Essick

physicsmuon massinstructional laboratoryparticle physics

Investigation of Exciton Ground State in Quantum Dots via Hamiltonian Diagonalization Method. American Journal of Physics (2008)

quantum computingquantum mechanicsluminescencequantum chemistryquantum materialscomputational physicscondensed matteratomic physicsphysicsnature physicmolecular physicsquantum engineeringelectron configurationquantum scienceapplied physicsquantum dots

Material Properties and Device Evaluations of Ecr-Deposited A-Si: H and A-Sic: H Films. (2002)

materials engineeringsolid-state electronicsceramicselectronicsadvanced materialsmaterial researchadvanced dielectricelectronic materialselectrical engineeringadvanced ceramicscharacterization (materials science)microelectronics reliabilitysemiconductorsapplied physicsthin filmsnanoelectronicsmaterials science

Conduction- and Valence-Band Offsets at the Hydrogenated Amorphous Silicon-Carbon/Crystalline Silicon Interface via Capacitance Techniques. Physical review. B, Condensed matter (1996)

interface (matter)solid-state electronicselectronicsinterface scienceadvanced dielectricmolecular electronicselectronic materialselectrical engineeringintegrated circuitsmicroelectronics reliabilitysemiconductorsapplied physicsthin filmsmicroelectronicsnanoelectronicsmaterials sciencevlsi technology

Dependence of the A-Si: H Defect Density of States on the Magnetic Field Profile of an Electron Cyclotron Resonance Microwave Plasma. Thin Solid Films (1994)

fusion scienceplasma chemistryparticle beammicrowave technologycomputational electromagneticselectromagnetismphysicsfusion engineeringfusionelectromagnetic fieldsmagnetohydrodynamicsmagnetismelectron configurationplasma physicselectrical engineeringmagnetic resonanceapplied physics

Characterization of a Bulk Semiconductor’s Band Gap via a Near-Absorption Edge Optical Transmission Experiment. American Journal of Physics (1993)

quantum heterostructuressolid-state electronicsphotonic crystalselectronicsluminescencelightwave technologynanophotonicsphysicsoptoelectronicsoptical materialselectronic materialselectrical engineeringlight scienceoptical propertiesadvanced functional materialssemiconductorsapplied physics

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John Essick

David W Brauer Professor of Physics

Reed College

Affiliations

Mathematical and Natural Sciences

Physics

John Essick is currently serving as a Mathematical And Natural Sciences David W Brauer Professor of Physics at Reed College.

Honors

Create free account to unlock more features

Experiences

Create free account to unlock more features

Education

Create free account to unlock more features

John Essick

Reed College

David W Brauer Professor of Physics

You can click a keyword to filter the displayed items

Notable Scholarly Works

Notable Federal Grants

Collaborators

Chaos in the Monopole Ion Trap. American Journal of Physics (2020)

nonlinear scienceelectromagnetismphysicsnonlinear phenomenonatomic physicsmagnetohydrodynamicsapplied physics

Chaos and Bifurcations in the Monopole Ion Trap. Bulletin of the American Physical Society (2018)

biophysicsnonlinear scienceelectromagnetismnonlinear phenomenonphysicsatomic physicsdynamical systems

Determining the Muon Mass Using a Scintillator-Based Detector. American Journal of Physics (2017)

particle physicsphysicsnuclear physicsnuclear scienceexperimental physicselementary particles

Capacitance-Voltage Profiling: Research-Grade Approach Versus Low-Cost Alternatives. American Journal of Physics (2014)

high voltage engineeringmeasurementcapacitance-voltage profilingpower deliverycomputer engineeringelectrical engineeringpower electronicselectric power systemsmicroelectronics

Determining the Muon Mass in an Instructional Laboratory. American Journal of Physics (2009)

Benjamin BrauChristopher MayRobert OrmondJohn Essick

physicsmuon massinstructional laboratoryparticle physics

Investigation of Exciton Ground State in Quantum Dots via Hamiltonian Diagonalization Method. American Journal of Physics (2008)

Material Properties and Device Evaluations of Ecr-Deposited A-Si: H and A-Sic: H Films. (2002)

Conduction- and Valence-Band Offsets at the Hydrogenated Amorphous Silicon-Carbon/Crystalline Silicon Interface via Capacitance Techniques. Physical review. B, Condensed matter (1996)

Dependence of the A-Si: H Defect Density of States on the Magnetic Field Profile of an Electron Cyclotron Resonance Microwave Plasma. Thin Solid Films (1994)

Characterization of a Bulk Semiconductor’s Band Gap via a Near-Absorption Edge Optical Transmission Experiment. American Journal of Physics (1993)

1
2
10 / page